Experimental Study of Modern Digital Measuring

Devices’ Errors

Dr. N.N. Vostroknutov, Senior Researcher, Associate Professor, Department of Electrical Measurements, FSAEI FVT ASMS, Moscow, Russia, vostrkit@yandex.ru

key words

microprocessor-based digital measuring devices, measurement result, errors, acceptable error limit

References

In this work, I have determined that the possibility of extending a number of requirements of the widely known document MI 1202–86 «Digital instruments and measuring transducers of voltage, current and resistance. General technical requirements and methods of tests» on modern microprocessor-based digital measuring instruments is beyond doubt. However, the possibility of extending to such devices some of the other requirements of this document, for example, on the rules for choosing verified indications, needs to be checked and clarified. In this article I have presented the data obtained during the experimental studies of dependence of modern digital devices’ error on the measured quantity’s value. Appropriate changes and additions to the methodology for selecting the indications verified during verification of such devices according to MI 1202–86 are proposed on the basis of these data.

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